CHINESE JOURNAL OF ENERGETIC MATERIALS
+Advanced Search

Impact Dynamic Response And Reliability of Electronic Control Modules in Electronic Detonators
Author:
Affiliation:

1.school of Chemical Engineering and Blasting, Anhui University of Science and Technology, Huainan 232001, China;2.Jiangxi Jiujiang Guotai New Materials Co., Ltd., Jiujiang 332217, China

Fund Project:

Grant support: Key Project of Natural Science Research in Anhui Higher Education Institutions (KJ2019A0121)

  • Article
  • |
  • Figures
  • |
  • Metrics
  • |
  • Reference
  • |
  • Related
  • |
  • Cited by
  • |
  • Materials
    Abstract:

    To investigate the reliability of electronic detonator control modules under impact initiation, a single-impact and superimposed-impact experimental system was constructed using concrete test blocks. By controlling equivalent explosive sources and equivalent spacing, the firing voltage range of the bridge wire was determined through the up-and-down method. The dynamic response of the electronic control module under impacts with varying hole spacings was analyzed. The findings indicate that temporary failures and permanent damage can be distinguished based on the bridge wire firing voltage range and the voltage drop at the delay termination. If the voltage falls into the unstable range (12.989-14.421 V), the firing status must be further assessed based on the remaining voltage at the delay termination. Some capacitors experience continuous voltage decline after impact, increasing the risk of misfiring in long-delay detonation networks. The module’s layout analysis within the casing reveals that tantalum capacitors exhibit significantly better impact resistance on the front side compared to the side, while chip performance remains largely unaffected by impact direction. Additionally, a comparison with continuous impact experiments shows that superimposed impacts exacerbate capacitor discharge phenomena. As the interval time increases, the coupling effect between successive impacts weakens, allowing capacitors to achieve more complete recovery through internal self-healing mechanisms, thereby significantly enhancing charge retention under secondary impacts. When the interval time exceeds 200 ms, the voltage drop caused by the secondary impact decreases by approximately 60% compared to a 50 ms interval, markedly improving the firing reliability of electronic detonators.

    Reference
    Related
    Cited by
Article Metrics
  • PDF:
  • HTML:
  • Abstract:
  • Cited by:
Get Citation

吴红波,叶紫阳,汪鑫齐,等.电子雷管电子控制模块冲击动态响应与可靠性[J].含能材料,2025,33(12):1448-1457.
WU Hong-bo, YE Zi-yang, REN Meng-yu, et al. Impact Dynamic Response And Reliability of Electronic Control Modules in Electronic Detonators[J]. Chinese Journal of Energetic Materials,2025,33(12):1448-1457.

Cope
History
  • Received:September 04,2025
  • Revised:December 22,2025
  • Adopted:December 12,2025
  • Online: December 23,2025
  • Published: December 25,2025