The relationship between characteristic parameters of micro-raman spectra and quality of different HMX crystals including single crystal, spherical crystal and industrial crystal was studied. Based on the comparison of peaks of micro-raman spectra, the 951 cm^-1 was determined to be the characteristic peak of HMX crystal. Statistical analysis was used for full width at half maximum (FWHM) of characteristic peak and the relative standard deviation (RSD) of measurements with the results that the FWHMs for single crystal, spherical crystal and industrial crystal were 15.18, 16.71, 17.84 cm^-1, and the RSDs for the three HMX crystals were 0.0143%, 0.0524% and 0.129%, respectively. While, by parallel test at one point for 12 times, the FWHM and RSD for HMX single crystal was 15.18 cm^-1 and 0.0122%. Through matching refractive micrograph and scanning electron microscopy images, the quality order for the three HMX crystals was single crystal > spherical crystal > industrial crystal. So, it can be conclude that the characteristic peak parameters of HMX crystal by micro-raman spectra can be used to evaluate the quality of HMX crystals: the closer the FWHM is to 15.18 cm^-1, the smaller the RSD, and the better the quality of HMX crystals.