Study on Positron Lifetime of Nano-void of TATB-based PBX
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TATB-based PBX samples with different densities were prepared by different press process, and their position lifetime spectra were measured. The spectra show that the positronium formation is negligible in TATB-based PBX, therefore the 2-component fit is applicable. The result shows an increasing dimension but decreasing concentration of nano-void during PBX pressing,which means the nano-void in TATB crystalline increased due to the damage and crack under pressure, however the nano-void of intergranular interface decreased.
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杨仍才,田勇,张伟斌,等. TATB基PBX纳米孔隙的正电子湮没寿命谱[J].含能材料,2011,19(2):200-203. YANG Reng-cai, TIAN Yong, ZHANG Wei-bin, et al. Study on Positron Lifetime of Nano-void of TATB-based PBX[J]. Chinese Journal of Energetic Materials,2011,19(2):200-203.