CHINESE JOURNAL OF ENERGETIC MATERIALS
+Advanced Search

Study on Positron Lifetime of Nano-void of TATB-based PBX
Author:
Affiliation:

Fund Project:

  • Article
  • |
  • Figures
  • |
  • Metrics
  • |
  • Reference
  • |
  • Related
  • |
  • Cited by
  • |
  • Materials
    Abstract:

    TATB-based PBX samples with different densities were prepared by different press process, and their position lifetime spectra were measured. The spectra show that the positronium formation is negligible in TATB-based PBX, therefore the 2-component fit is applicable. The result shows an increasing dimension but decreasing concentration of nano-void during PBX pressing,which means the nano-void in TATB crystalline increased due to the damage and crack under pressure, however the nano-void of intergranular interface decreased.

    Reference
    Related
    Cited by
Article Metrics
  • PDF:
  • HTML:
  • Abstract:
  • Cited by:
Get Citation

杨仍才,田勇,张伟斌,等. TATB基PBX纳米孔隙的正电子湮没寿命谱[J].含能材料,2011,19(2):200-203.
YANG Reng-cai, TIAN Yong, ZHANG Wei-bin, et al. Study on Positron Lifetime of Nano-void of TATB-based PBX[J]. Chinese Journal of Energetic Materials,2011,19(2):200-203.

Cope
History
  • Received:April 14,2010
  • Revised:October 31,2010
  • Adopted:August 11,2010
  • Online: February 22,2012
  • Published: