CHINESE JOURNAL OF ENERGETIC MATERIALS
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一种弹药PBX装药的贮存老化机理及安全性
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作者单位:

(西安近代化学研究所, 陕西 西安 710065)

作者简介:

尹俊婷(1964-),女,副研究员,从事弹药设计及寿命评估研究。e-mail: yjt1211@sohu.com 通信联系人: 罗颖格(1982-),女,工程师,从事杀爆战斗部设计。e-mail: 1371965619@qq.com

通讯作者:

罗颖格(1982-),女,工程师,从事杀爆战斗部设计。e-mail: 1371965619@qq.com

基金项目:

国家重大基础科研专项(004040204)


Storage Aging Mechanism and Safety of Certain Ammunition PBX Charge
Author:
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(Xi′an Modern Chemistry Research Institute, Xi′an 710065, China)

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    摘要:

    运用CT扫描了贮存4、8、12、16年高聚物粘结炸药(PBX)弹药装药结构, 采用重量分析法, 液体静力称量法和红外光谱分析了不同贮存年限装药的组成、密度及析出物, 利用扫描电镜观察贮存4、12、16年弹药装药微观结构, 测试弹药装药撞击感度。结果表明, 装药逐渐出现裂纹、孔洞、空腔等老化现象, 由固态变为粘稠态, 并有硅橡胶析出; 装药密度及组分中HMX含量由贮存4年时的1.56 g·cm-3、85%逐渐提高到16年时的1.66 g·cm-3、95%;装药断面由平整光滑逐渐变为凸凹不平。裂纹可能是因炸药颗粒与粘结剂发生脱离, 内部微裂纹扩展引起, 孔洞、空腔等老化现象可能是粘结剂大分子网状结构降解成环状小分子引起。老化使装药撞击感度由贮存4年时的8%逐渐提高到16年时的44%。

    Abstract:

    The polymer-bonded explosive(PBX) charge structures of certain ammunitions stored for 4, 8, 12, 16 years were investigated by CT scanning.The composition, density and precipitates of different storage periods were analyzed by gravimetric method, hydrostatic weighing method and IR.Simultaneously, the charge micro structures stored for 4, 12 and 16 years were observed by SEM.And the impact sensitivity was also investigated.Results indicate that PBX charge appears cracks, holes and cavities after long term storage.Meanwhile, the charge state is changed from sticky to solid along with silicon rubber separated out, and the rupture surface of charg changes from smooth to uneven.And also, the density, HMX content and impact sensitivity of charge storage for 4 years increase from 1.56 g·cm-3 to 1.66 g·cm-3 of charge storage for 16 years, 85% to 95% and 8% to 44%.The cracks may be caused by detachment of explosive particles from binder and microcracks propagation.And aging phenomenon of holes and cavities maybe appeared due to degradation of adhesive molecular network structure into small cyclic molecule.

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引用本文

尹俊婷,罗颖格,陈智群,等.一种弹药PBX装药的贮存老化机理及安全性[J].含能材料, 2015, 23(11):1051-1054. DOI:10.11943/j. issn.1006-9941.2015.11.003.
YIN Jun-ting, LUO Ying-ge, CHEN Zhi-qun, et al. Storage Aging Mechanism and Safety of Certain Ammunition PBX Charge[J]. Chinese Journal of Energetic Materials, 2015, 23(11):1051-1054. DOI:10.11943/j. issn.1006-9941.2015.11.003.

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历史
  • 收稿日期: 2015-02-09
  • 最后修改日期: 2015-04-28
  • 录用日期: 2015-04-29
  • 在线发布日期: 2015-10-19
  • 出版日期: 2015-10-28