CHINESE JOURNAL OF ENERGETIC MATERIALS
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TATB基PBX纳米孔隙的正电子湮没寿命谱
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杨仍才(1986-),男,在读硕士研究生,主要从事炸药无损检测研究。e-mail: yrc_9999@163.com

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国防预先研究(42604030401)


Study on Positron Lifetime of Nano-void of TATB-based PBX
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    摘要:

    为研究压制参数对TATB基高聚物粘结炸药(PBX)微观结构的影响,压制了密度为1.6~1.9 g·cm-3的PBX,采用了正电子湮没寿命谱(PALS)技术表征了其微观结构,讨论了不同压制密度PBX的纳米孔隙的变化。结果显示: 压制密度越大,PBX中纳米孔隙浓度越小,平均尺寸越大,这表明压制过程中,PBX界面孔隙不断减小,TATB晶体内部孔隙却不断增大。

    Abstract:

    TATB-based PBX samples with different densities were prepared by different press process, and their position lifetime spectra were measured. The spectra show that the positronium formation is negligible in TATB-based PBX, therefore the 2-component fit is applicable. The result shows an increasing dimension but decreasing concentration of nano-void during PBX pressing,which means the nano-void in TATB crystalline increased due to the damage and crack under pressure, however the nano-void of intergranular interface decreased.

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杨仍才,田勇,张伟斌,等. TATB基PBX纳米孔隙的正电子湮没寿命谱[J].含能材料, 2011, 19(2):200-203. DOI:10.3969/j. issn.1006-9941.2011.02.017.
YANG Reng-cai, TIAN Yong, ZHANG Wei-bin, et al. Study on Positron Lifetime of Nano-void of TATB-based PBX[J]. Chinese Journal of Energetic Materials, 2011, 19(2):200-203. DOI:10.3969/j. issn.1006-9941.2011.02.017.

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  • 收稿日期: 2010-04-14
  • 最后修改日期: 2010-10-31
  • 录用日期: 2010-08-11
  • 在线发布日期: 2012-02-22
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