CHINESE JOURNAL OF ENERGETIC MATERIALS
+高级检索
光谱辐射测量金属薄膜桥电爆炸温度
作者:
作者单位:

作者简介:

通讯作者:

基金项目:


Electrical Explosion Temperature of Metal Thin Film Bridge Measured by Spectrum Radiation Method
Author:
Affiliation:

Fund Project:

  • 摘要
  • |
  • 图/表
  • |
  • 访问统计
  • |
  • 参考文献
  • |
  • 相似文献
  • |
  • 引证文献
  • |
  • 支撑附件
    摘要:

    采用光谱辐射法测量了Ni-Cr金属薄膜桥的电爆炸温度。通过六通道瞬态光学高温计测量金属薄膜桥电爆炸时在514 nm、631 nm、692 nm、715 nm、910 nm、1068 nm波长处的辐照强度,根据黑体辐射理论计算温度值。研究表明,金属薄膜桥在50 V、100 μF条件下电爆炸时的最高温度在5000 K左右,4000 K以上持续时间为300 ns。

    Abstract:

    The electrical explosion temperature of Ni-Cr thin film bridge was studied by the spectrum radiation method. The radiation intensity was measured at wavelength of 514 nm,631 nm, 692 nm, 715 nm, 910 nm, 1068 nm via six-channel instantaneous optical pyrometer, respectively, when metal thin film bridge fired, and then the ignition temperature was calculated based on blackbody radiation theory. Results shows that when metal thin film bridge is exploded in the conditions of 50 V and 100 μF, the maximum temperature is around 5000 K, and the duration time which the temperature is maintained above 4000 K is 300 ns.

    参考文献
    相似文献
    引证文献
文章指标
  • PDF下载次数:
  • HTML阅读次数:
  • 摘要点击次数:
  • 引用次数:
引用本文

王广海,李国新,焦清介,等.光谱辐射测量金属薄膜桥电爆炸温度[J].含能材料, 2009, 17(5):616-618. DOI:10.3969/j. issn.1006-9941.2009.05.027.
WANG Guang-hai, LI Guo-xin, JIAO Qing-jie, et al. Electrical Explosion Temperature of Metal Thin Film Bridge Measured by Spectrum Radiation Method[J]. Chinese Journal of Energetic Materials, 2009, 17(5):616-618. DOI:10.3969/j. issn.1006-9941.2009.05.027.

复制
历史
  • 收稿日期: 2009-02-26
  • 最后修改日期: 2009-07-30
  • 录用日期: 2009-05-15
  • 在线发布日期: 2009-10-15
  • 出版日期: 2009-10-25