CHINESE JOURNAL OF ENERGETIC MATERIALS
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多孔硅/高氯酸钠复合材料合成与爆炸特性研究
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黎学明(1967-),男,教授,博士生导师,现主要从事应用电化学、光电子材料与器件研究。email: xuemingli@cqu.edu.cn

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国家自然科学基金资助项目


Synthesis and explosion characteristics of porous Silicon/NaClO4 composites
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    摘要:

    采用电化学阳极氧化法制备多孔硅,考察不同阳极氧化条件下多孔硅孔隙率及膜厚变化规律,分析阳极氧化条件、高氯酸钠溶液浓度及多孔硅贮存方法等对多孔硅/高氯酸钠复合材料爆炸特性的影响。结果表明,多孔硅孔隙率随阳极氧化电流密度增加而增大,当电流密度达到50mA.cm-2时趋于稳定,当氢氟酸浓度增加时多孔硅孔隙率反而减小,而阳极氧化时间延长时多孔硅孔隙率呈先增加后减小现象,且氧化时间为30min时孔隙率最大;多孔硅膜厚随时间增加而增大,其生长速度为2μm.min-1左右;当新鲜多孔硅形成后,其表面出现微裂缝,内部含大量长度为40μm,宽度为2~3μm硅柱;当新鲜或乙醇贮存7天内的多孔硅浸入浓度不小于0.1g.mL-1NaClO4甲醇溶液后,形成的多孔硅/高氯酸钠复合材料能够发生爆炸。

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    Porous silicon was prepared by electrochemical anodized method,and the porosity and film depth of porous silicon prepared under different anodized conditions as well as the effect of anodized conditions,sodium perchlorate concentration and storage methods on the explosion characteristics were studied. Results show that the porosity of porous silicon increases with the increasing of current density,and is stable when current density is 50 mA·cm-2. With the increasing of hydrofluoric acid concentration,the porosity of porous silicon decreases; with the increasing of anodizing time,the porosity increases firstly and then decreases; the porosity reaches the maximum when the anodizing time is 30 min. Film depth is thicker when anodizing time is longer,and its growth speed is about 2 μm·min-1. Porous silicon cracks on surface and contains silicon columns internal which are 40 μm in length and 2-3 μm in width. Porous silicon/NaClO4 composite can explode when sodium perchlorate concentration is higher than 0.1 g·mL-1 and the porous silicon is fresh or dipping in the ethanol within 7 days.

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黎学明,胡欣,黄辉,等.多孔硅/高氯酸钠复合材料合成与爆炸特性研究[J].含能材料, 2008, 16(6):727-730.
LI Xue-ming. Synthesis and explosion characteristics of porous Silicon/NaClO4 composites[J]. Chinese Journal of Energetic Materials, 2008, 16(6):727-730.

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  • 收稿日期: 2008-01-10
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  • 在线发布日期: 2011-05-06
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